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Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974

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索取号:TN141-53/E801/1974
作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、
出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.

The Mechanical design process

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索取号:TH122/E20031
作者:Ullman、 David G.、 1944-、
出版社:New York : McGraw-Hill, c1992.

Design of concrete structures

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索取号:TU370.4/E20031.11
作者:Nilson、 Arthur H.、Winter、 George、 1907-、Urquhart、 Leonard Church、 1886- Design of concrete structures.、
出版社:New York : McGraw-Hill, c1991.

Computer and communications security : strategies for the 1990s

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索取号:TP309/E20031
作者:Cooper、 James Arlin.、
出版社:New York : Intertext Publications, McGraw-Hill, c1989.

Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971

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索取号:TN14-53/E801/11
作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、
出版社:San Francisco, Calif. : San Francisco Press, c1971.

Record of the 10th symposium on electron, ion, and laser beam technology

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索取号:TN14-53/E801/10
作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、
出版社:San Francisco : San Francisco Press, [c1969].

1987 proceedings : 37th Electronic Components Conference ; May 11-13, 1987, the Boston Park Plaza Hotel & Towers, Boston, Massachusetts

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索取号:TN11-53/E701/37
作者:Electronic Components Conference (37th : 1987 : Boston、 Mass.)、IEEE Components、 Hybrids、 and Manufacturing Technology Society、Electronic Industries Association、
出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Order from IEEE Service Center, 1987]

Time-saver standards for architectural design data

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索取号:TU318/E20031.6
作者:
出版社:New York : McGraw-Hill, 1983.

Control system design and simulation

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索取号:TP271/E20031
作者:Golten、 Jack.、Verwer、 Andy.、
出版社:London ; New York : McGraw-Hill, c1991.

IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973

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索取号:TN102-53/E801/11
作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、
出版社:New York, N.Y. : IEEE, c1973.

Proceedings of the Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry, Monday, 10th July to Thursday, 13th July, 1967 at the University of Nottingham

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索取号:TN102-53/E701.r/1967
作者:Joint I.E.R.E.-I.Prod.E.-I.E.E. Conference on the Integration of Design and Production in the Electronics Industry (1967 : University of Nottingham)、Institution of Electronic and Radio Engineers.、Institution of Production Engineers (Great Britain)、Institution of Electrical Engineers. Electronics Division.、
出版社:London : Institution of Electronic and Radio Engineers, c1968.

1978 WESCON technical papers : papers presented at the Western Electronic Show and Convention in Los Angeles, California, September 12-14, 1978

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索取号:TN1-53/E806/1978
作者:Western Electronic Show and Convention (1978 : Los Angeles)、
出版社:[El Segundo, Calif.] : Electronic Conventions, c1978.

Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973

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索取号:TN06-53/E801/11
作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.

Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972

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索取号:TN06-53/E801/10
作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.

Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971

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索取号:TN06-53/E801/9
作者:International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、
出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.

Statistical sampling : past, present, and future theoretical and practical

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索取号:
作者:Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、
出版社:Philadelphia, PA : ASTM, c1990.
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